X-RAY Photoelectron Spectroscopy (XPS)

XPS (X-Ray Photoelectron Spectroscopy)

The technique X-Ray Photoelectron Spectroscopy (XPS) allows to characterize the surface of a sample from a compositional point of view, both qualitatively and quantitatively, to a depth of 10 nanometers and can detect the chemical bonds formed between the different elements in the spectrum (oxidation, sulfide-sulfate, ...)

APPLICATION RANGE:

• ANALYSIS OF POWDERS AND CHEMICAL BONDS;
• ANALYSIS OF SURFACE TREATMENTS;
• ANALYSIS OF COATINGS - THICKNESS LESS THAN 1 MICRON.

Minimum Sensitivity: 0.1% by weight concentration.

Samples maximum size 1cm x 1cm x 1cm  (both solids and powders), it is difficult  to perform on curved samples.
 
Sigla.com - Internet Partner