Analysis by SEM-FIB

The SEM-FIB is an electron microscope with a resolution of 2nm, which allows to dig without damaging the surface of a sample and look at his section.

APPLICATION RANGE:

• THICKNESS DETECTION FOR COATINGS MEASURING LESS THAN 2-3 microns.

Maximum sample dimension 2cm x 2cm x 1.5 cm
 
Accreditations Aster Accredia Accredia Accredia Tuv Nord Nadcap Crit
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